MEMS Vibration Measurement with VibroMicro VM-S-100

MEMS Vibration Measurement with VibroMicro VM-S-100

1. Project Background and Technical Requirements

1.1 MEMS Technology Characteristics

Micro-Electro-Mechanical Systems (MEMS) are miniature systems integrating micro-sensors, micro-actuators, signal processing, and control circuits. Their typical features include:

  • Micro-scale Size: Structural dimensions on the micrometer to millimeter scale.

  • High Resonance Frequencies: Operating frequencies typically range from kHz to MHz.

  • Extremely Small Vibration Amplitudes: Displacement ranges from nanometers to micrometers.

1.2 Measurement Challenges

  • Limitations of Traditional Methods: Contact measurements introduce loading effects, altering the dynamic characteristics of MEMS structures.

  • Resolution Requirements: Nanometer-level or higher displacement resolution is needed.

  • Frequency Response: Measurement bandwidth up to MHz levels is required.

  • Spatial Resolution: Micron-level laser spot positioning accuracy is necessary.


2. Test System Configuration

2.1 Core Measurement Equipment

Main Equipment: Dynatronic VibroMicro VM-S-100 Laser Doppler Vibrometer

Key Parameters:

  • Displacement Resolution: < 1 pm/√Hz

  • Frequency Range: DC ~ 20 MHz

  • Laser Spot Size: < 10 μm

2.2 Auxiliary Systems

Excitation System:

  • Piezoelectric Shaker

  • Electrostatic Drive Setup

  • Signal Generator + Power Amplifier

Positioning System:

  • High-Precision Micro-Positioning Stage

  • Microscope Vision Positioning System

Environmental Control:

  • Vibration-isolated Optical Table

  • Vacuum Chamber (Optional)


MEMS Vibration Measurement with VibroMicro VM-S-100

3. Test Methods and Procedures

3.1 Resonance Characteristic Testing

Objective: Obtain the frequency response characteristics of the MEMS structure.

Procedure:

System Calibration

  • Precisely locate measurement points using the microscope system.

  • Adjust the laser beam to be perpendicular to the measurement surface.

Frequency Sweep Test

  • Set sweep range: Determined based on the MEMS design frequency.

  • Sweep type: Linear or logarithmic sweep.

  • Sweep rate: Ensures quasi-steady-state response.

Data Acquisition

  • Acquire vibration velocity/displacement signals.

  • Record the input excitation signal as a reference.

Result Analysis

  • Plot the amplitude-frequency characteristic curve.

  • Identify resonance frequency points.

  • Calculate the Quality Factor (Q factor).

3.2 Modal Characteristic Testing

Objective: Obtain the complete vibration modes of the MEMS cantilever.

Procedure:

Measurement Planning

  • Define a grid of measurement points on the cantilever surface.

  • Plan the automated scanning path.

Point-by-Point Measurement

  • Control the positioning stage to locate each measurement point sequentially.

  • Perform resonance frequency tests at each point.

  • Record the vibration amplitude and phase at each point.

Data Synthesis

  • Reconstruct the vibration pattern of the cantilever.

  • Analyze the shapes of different vibration modes.

  • Calculate modal parameters (frequency, damping, mode shape).


4. Key Test Results

4.1 Typical Resonance Characteristic Data

  • Resonant Frequency: 125.6 kHz

  • -3dB Bandwidth: 1.2 kHz

  • Quality Factor Q: ~105

  • Maximum Vibration Amplitude: 850 nm (@ 5V drive voltage)

4.2 Modal Analysis Results

  • First Bending Mode: 45.3 kHz

  • Second Bending Mode: 284.7 kHz

  • First Torsional Mode: 156.2 kHz

  • Mode Shapes: Clearly show node and anti-node positions for each mode.


5. Technical Advantages

5.1 Measurement Performance Advantages

  • Non-Interfering Measurement: Non-contact method avoids mass-loading effects.

  • Ultra-High Resolution: Sub-nanometer displacement resolution.

  • Wide Bandwidth Coverage: Fully covers the MEMS operating frequency range.

  • High Spatial Resolution: Micron-sized spot for accurate targeting of micro-structures.

5.2 Operational Advantages

  • Fast Measurement: Automated scanning improves test efficiency.

  • Visualized Results: Intuitive display of vibration modes.

  • Quantitative Analysis: Provides precise numerical results.


6. Application Value

6.1 R&D Stage

  • Design Verification: Validate the accuracy of simulation models.

  • Performance Optimization: Guide adjustments of structural parameters.

  • Failure Analysis: Identify structural weaknesses and resonance anomalies.

6.2 Production Stage

  • Quality Control: Online detection of resonance frequency consistency.

  • Parameter Screening: Grade devices based on vibration characteristics.

  • Reliability Assessment: Monitor performance changes during long-term use.

6.3 Typical Application Devices

  • MEMS Accelerometers

  • Gyroscopes

  • Micro-Mirror Arrays

  • RF MEMS Switches

  • Micro-Pressure Sensors


7. Implementation Case Study

Test Object: Silicon-based MEMS Micro-Mirror Array

Test Content:

  • Resonance frequency testing of a single micro-mirror unit.

  • Frequency consistency check across the array.

  • Modal analysis during operation.

Test Results:

  • Resonance Frequency Consistency: ±0.5%

  • Scan Angle Linearity: > 99%

  • Identified abnormal vibration modes, guiding design improvements.

Conclusion:

The Dynatronic VibroMicro VM-S-100 Laser Doppler Vibrometer provides a perfect vibration measurement solution for MEMS devices. Its exceptional resolution, bandwidth, and non-contact characteristics enable precise characterization of the dynamic performance of MEMS structures, providing reliable data support for R&D optimization and quality control. This technology has become an indispensable measurement tool in the MEMS field, driving micro/nano technology towards higher performance.

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